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Opto Edu A62.4501 Scanning Microscope Curve Basic Level Atomic Force

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Opto Edu A62.4501 Scanning Microscope Curve Basic Level Atomic Force

Brand Name : OPTO-EDU

Model Number : A62.4501

Certification : CE, Rohs

Place of Origin : China

MOQ : 1pc

Price : FOB $1~1000, Depend on Order Quantity

Payment Terms : L/C,T/T,Western Union

Supply Ability : 5000 pcs/ Month

Delivery Time : 5~20 Days

Packaging Details : Carton Packing, For Export Transportation

Work Mode : "Contact Mode Tapping Mode 【Optional】 Friction Mode Phase Mode Magnetic Mode Electrostatic Mode"

Current Spectrum Curve : "RMS-Z Curve F-Z Force Curve"

XY Scan Range : 20×20um

XY Scan Resolution : 0.2nm

Z Scan Range : 2.5um

Y Scan Resolution : 0.05nm

Scan Speed : 0.6Hz~30Hz

Scan Angle : 0~360°

Sample Size : "Φ≤90mm H≤20mm"

Shock-Absorbing Design : "Spring Suspension Metal Shielding Box"

Optical Syestem : "4x Objective Resolution 2.5um"

Output : USB2.0/3.0

Software : Win XP/7/8/10

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  • Basic Level, Separate Controller & Main Body Design, With Contact Mode, Tapping Mode,
  • Scan Range XY 20x20um, Z 2.5um, Scan Resolution XY 0.2nm, Z 0.05nm
  • Sample Size Dia.<90mm, H<20mm, Stage Moving 15x15mm, Optical Objective APO 4x Resolution 2.5um
  • Scan Speed 0.6~30Hz, Scan Angle 0-360°, Output USB3.0 For Win7/8/10/11
  • Optional Work Mode: Friction Mode, Phase Mode, Magnetic Mode, Electrostatic Mode
Opto Edu A62.4501 Scanning Microscope Curve Basic Level Atomic Force
Opto Edu A62.4501 Scanning Microscope Curve Basic Level Atomic Force
◆ The laser detection head and the sample scanning stage are integrated, the structure is very stable, and the anti-interference is strong

◆ Precision probe positioning device, laser spot alignment adjustment is very easy

◆ The single-axis drive sample automatically approaches the probe vertically, so that the needle tip is perpendicular to the sample scan

◆ The intelligent needle feeding method of motor-controlled pressurized piezoelectric ceramic automatic detection protects the probe and the sample

◆ High-precision and wide-ranging piezoelectric ceramic scanners can be freely selected

◆ High-magnification objective lens automatic optical positioning, no need to focus, real-time observation and positioning of the probe sample scanning area

◆ Spring suspension shockproof method, simple and practical, good shockproof effect

◆ Metal shielded soundproof box, built-in high-precision temperature and humidity sensor, real-time monitoring of the working environment

◆ Integrated scanner nonlinear correction user editor, nanometer characterization and measurement accuracy better than 98%

Opto Edu A62.4501 Scanning Microscope Curve Basic Level Atomic Force
Opto Edu A62.4501 Scanning Microscope Curve Basic Level Atomic Force

Specification A62.4500 A62.4501 A62.4503 A62.4505
Work Mode Tapping Mode

【Optional】
Contact Mode
Friction Mode
Phase Mode
Magnetic Mode
Electrostatic Mode		 Contact Mode
Tapping Mode

【Optional】
Friction Mode
Phase Mode
Magnetic Mode
Electrostatic Mode		 Contact Mode
Tapping Mode

【Optional】
Friction Mode
Phase Mode
Magnetic Mode
Electrostatic Mode		 Contact Mode
Tapping Mode

【Optional】
Friction Mode
Phase Mode
Magnetic Mode
Electrostatic Mode
Current Spectrum Curve RMS-Z Curve

【Optional】
F-Z Force Curve		 RMS-Z Curve
F-Z Force Curve		 RMS-Z Curve
F-Z Force Curve		 RMS-Z Curve
F-Z Force Curve
XY Scan Range 20×20um 20×20um 50×50um 50×50um
XY Scan Resolution 0.2nm 0.2nm 0.2nm 0.2nm
Z Scan Range 2.5um 2.5um 5um 5um
Y Scan Resolution 0.05nm 0.05nm 0.05nm 0.05nm
Scan Speed 0.6Hz~30Hz 0.6Hz~30Hz 0.6Hz~30Hz 0.6Hz~30Hz
Scan Angle 0~360° 0~360° 0~360° 0~360°
Sample Size Φ≤90mm
H≤20mm		 Φ≤90mm
H≤20mm		 Φ≤90mm
H≤20mm		 Φ≤90mm
H≤20mm
XY Stage Moving 15×15mm 15×15mm 25×25um 25×25um
Shock-Absorbing Design Spring Suspension Spring Suspension
Metal Shielding Box		 Spring Suspension
Metal Shielding Box		 -
Optical Syestem 4x Objective
Resolution 2.5um		 4x Objective
Resolution 2.5um		 10x Objective
Resolution 1um		 Eyepiece 10x
Infinity Plan LWD APO 5x10x20x50x
5.0M Digital Camera
10" LCD Monitor, With Measuring
LED Kohler Illumination
Coaxial Coarse & Fine Focusing
Output USB2.0/3.0 USB2.0/3.0 USB2.0/3.0 USB2.0/3.0
Software Win XP/7/8/10 Win XP/7/8/10 Win XP/7/8/10 Win XP/7/8/10

Opto Edu A62.4501 Scanning Microscope Curve Basic Level Atomic Force
　 Resolution Working Condition Working Temperation Damge to Sample Inspection Depth
SPM Atom Level 0.1nm Normal, Liquid, Vacuum Room or Low Temperation None 1~2 Atom Level
TEM Point 0.3~0.5nm
Lattice 0.1~0.2nm		 High Vaccum Room Temperation Small Usually <100nm
SEM 6-10nm High Vaccum Room Temperation Small 10mm @10x
1um @10000x
FIM Atom Level 0.1nm Super High Vaccum 30~80K Damge Atom Thickness
Microscope Optical Microscope Electron Microscope Scanning Probe Microscope
Max Resolution (um) 0.18 0.00011 0.00008
Remark Oil immersion 1500x Imaging diamond carbon atoms Imaging high-order graphitic carbon atoms
Opto Edu A62.4501 Scanning Microscope Curve Basic Level Atomic Force Opto Edu A62.4501 Scanning Microscope Curve Basic Level Atomic Force Opto Edu A62.4501 Scanning Microscope Curve Basic Level Atomic Force
Probe-Sample Interaction Measure Signal Information
Force Electrostatic Force Shape
Tunnel Current Current Shape, Conductivity
Magnetic Force Phase Magnetic Structure
Electrostatic Force Phase charge distribution
Opto Edu A62.4501 Scanning Microscope Curve Basic Level Atomic Force
Opto Edu A62.4501 Scanning Microscope Curve Basic Level Atomic Force
Opto Edu A62.4501 Scanning Microscope Curve Basic Level Atomic Force
Opto Edu A62.4501 Scanning Microscope Curve Basic Level Atomic Force

Product Tags:

curve basic level scanning microscope

      

atomic force scanning microscope

      

scanning opto edu microscope

      
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Opto Edu A62.4501 Scanning Microscope Curve Basic Level Atomic Force Images

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